User:Jpotter2: Difference between revisions
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== ''' | =='''Homework 1: Patent Selection''' | ||
=== '''US Patent 4188122 - Interferometer (1980)''' === | |||
This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam. | This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam. | ||
Revision as of 17:18, 28 January 2011
==Homework 1: Patent Selection
US Patent 4188122 - Interferometer (1980)
This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam.
