User:Jpotter2: Difference between revisions
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This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam. | This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam. | ||
=='''Homeworks'''== | |||
[[Homework 1 - Patent Selection]] | |||
[[Homework 2 - Nonobviousness Analysis - Selected Patent]] | |||
[[Homework 3 - Nonobviousness Analysis - Graham Patent]] | |||
Revision as of 03:39, 3 February 2011
Homework 1: Patent Selection
US Patent 4188122 - Interferometer (1980)
This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam.
Homeworks
Homework 1 - Patent Selection Homework 2 - Nonobviousness Analysis - Selected Patent Homework 3 - Nonobviousness Analysis - Graham Patent
