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Homework 1: Patent Selection

US Patent 4188122 - Interferometer (1980)

This patent describes a laser interferometer to measure beam distortion. The interferometer splits a laser beam into two different components and directs one component through a test area while the other remains unchanged. The beams are recombined to produce an interference pattern that can be electronically sensed and analyzed to evaluate the distortion of the test beam.


Homeworks

Homework 1 - Patent Selection

Homework 2 - Nonobviousness Analysis - Selected Patent

Homework 3 - Nonobviousness Analysis - Graham Patent